ANALYSIS OF RAY TRACING THROUGH OPTICAL SYSTEMS WITH METAMATERIAL ELEMENTS

A. O. Voznesenskaya, D. . Kabanova


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Abstract

A common expression of the refraction law is proposed. The expression allows performing ray tracing through optical media with both positive and negative refraction index. Results of computer simulation are presented. It is shown that optical systems including elements from metamaterials provide low aberrations.


Keywords: optical systems computation, nanostructured optical metamaterials
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