glue connection, stress state, ellipsometry, connection layer, induced birefringence, photoelasticity.

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ELLIPSOMETRIC RESEARCH MODEL OF THE OPTICAL GLUE CONNECTIONS CHARACTERISTICS

M. . Aleksandrov, Y. T. Nagibin, V. A. Trofimov, M. . Shvanova


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Abstract

An opportunity to carry out researches of the glue connections stress state for the optical parts with the help of the compensatory type ellipsometer, working at PCSA scheme, is considered. Ellipsometric research mathematical model of the induced birefringence in connection layer caused by the integral effect of photoelasticity is described


Keywords: glue connection, stress state, ellipsometry, connection layer, induced birefringence, photoelasticity.
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