Vladimir . Sokolov

Work place: Ioffe Physical Technical Institute
Degree: D.Sc., Professor
Sokolov V. ., Huynh Cong Tu . POROUS SILICON THIN FILM EFFECT ON SPECTRAL CHARACTERISTIC OF SILICON PHOTODIODE
The article was published in issue 4(74) in 2011
Copyright 2001-2017 ©
Scientific and Technical Journal
of Information Technologies, Mechanics and Optics.
All rights reserved.

Яндекс.Метрика