doi: 10.17586/2226-1494-2023-23-4-703-710


Peculiarities of growing Ga1–xInxAs solid solutions on GaAs substrates in the field of a temperature gradient through a thin gas zone

O. V. Devitsky, L. S. Lunin, D. V. Mitrofanov, I. A. Sysoev, D. A. Nikulin, O. M. Chapura


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Devitsky O.V., Lunin L.S., Mitrofanov D.V., Sysoev I.A., Nikulin D.A., Chapura O.M. Peculiarities of growing Ga1–xInxAs solid solutions on GaAs substrates in the field of a temperature gradient through a thin gas zone. Scientific and Technical Journal of Information Technologies, Mechanics and Optics, 2023, vol. 23, no. 4, pp. 703–710 (in Russian). doi: 10.17586/2226-1494-2023-23-4-703-710


Abstract
Solid solution Ga1–xInxAs is widely used in modern optoelectronics as a material for p-i-n photodetectors, lasers emitting in the spectral range 1.3–1.55 μm. In this paper, the features of obtaining Ga1–xInxAs films by the method of zone recrystallization with a temperature gradient, the essence of which is the sequential recrystallization of parts of the source melt moving under the action of a temperature gradient, are studied. Ga1–xInxAs films on GaAs substrates were obtained in a temperature gradient field through a thin gas zone in a specially designed graphite cassette. The films were prepared at a temperature of 1123 K with a temperature gradient of 30 K/cm. A 1:1 mixture of nitrogen and hydrogen was used as the carrier gas. The thickness of the gas zone between the source and the substrate was 1 mm. The deposition time for all films was 10 min. The growth kinetics, morphology, and structure of the chemical bonds of the obtained films have been studied. Based on the results of theoretical calculations, it was found that an increase in the concentration of indium leads to a decrease in the film growth rate to 0.3137 µm/min. A comparison of the results of theoretical calculations with experimental results showed a discrepancy between the growth rates for films with an indium concentration in the growth source of more than 20 %, which is primarily due to the segregation of indium on the film surface. The films have an RMS roughness from 9.1 to 24.2 nm. It is shown that the content of indium in the growth source significantly affects the properties of the grown films and leads to a decrease in the growth rate, an increase in the elastic stresses in the layer, and a nonstoichiometric composition of the film. It has been established that with an increase in the indium concentration in the film, a significant shift in the frequency of the LO and TO phonon modes of GaAs to the left by 13 and 16 cm–1, respectively, is observed due to the influence of elastic mechanical stresses. The presented results show that Ga1–xInxAs solid solution films with short-range order of chemical bonds were obtained by the method of zone recrystallization in a temperature gradient.

Keywords: temperature gradient field, thin gas band, III–V compounds, Ga1–xInxAs, Raman spectroscopy, atomic force microscopy

Acknowledgements. The work was carried out within the framework of the State Assignment no. 122020100254-3 (study of the surface morphology of films) and no. 122020100326-7 (Raman studies and determination of the chemical composition) of the SSC RAS as well as using the resources of the Center for Collective Use of the North Caucasus Federal University and with financial support of the Ministry of Education and Science of the Russian Federation, unique identifier of the project RF-2296.61321X0029 (agreement no. 075-15-2021-687) (obtaining experimental film samples). The authors express their gratitude to the North Caucasus Federal University for their help in the framework of the competition to support projects of scientific groups and individual scientists.

References
  1. Zimmer M., Trachtmann A., Jetter M., Michler P. MOVPE grown InGaAs quantum dots with emission near 1.3 µm for electrically driven single-photon sources. Journal of Crystal Growth, 2023, vol. 605, pp. 127081. https://doi.org/10.1016/j.jcrysgro.2023.127081
  2. Ozturk O., Ozturk E., Elagoz S. Linear and nonlinear optical absorption coefficient and electronic features of triple GaAlAs/GaAs and GaInAs/GaAs quantum wells depending on barrier widths. Optik, 2019, vol. 180, pp. 394–405. https://doi.org/10.1016/j.ijleo.2018.11.091
  3. Paulauskas T., Pačebutas V., Geižutis A., Kamarauskas M., Drazdys M., Rudzikas M., Kondrotas R., Naujokaitis A., Nevinskas I., Šebeka B., Strazdienė V., Krotkus A. Performance analysis of GaAsBi/InGaAs heterostructure for III-V multi-junction solar cells. Solar Energy Materials and Solar Cells, 2022, vol. 248, pp. 112013. https://doi.org/10.1016/j.solmat.2022.112013
  4. Nishiyama S., Takenaka C., Kusunoki T., Fujii T., Nakajima K. LPE growth of InP and InGaAs on MQW layers below 500°C. Journal of Crystal Growth, 1990, vol. 104, no. 4, pp. 809–814. https://doi.org/10.1016/0022-0248(90)90106-U
  5. Bahari A., Salianeh M.G., Biranvand N. Structural nonlinear effects in In0.53Ga0.47As/GaAs heterostructure bipolar transistor lasers. Optik, 2015, vol. 126, no. 24, pp. 5249–5252. https://doi.org/10.1016/j.ijleo.2015.08.269
  6. Li Y., Yan X., Zhang X., Wu Ch., Zheng J., Zha Ch., Fu T., Gong L., Ren X. Low-threshold miniaturized core-shell GaAs/InGaAs nanowire/quantum-dot hybrid structure nanolasers. Optics and Laser Technology, 2022, vol. 152, pp. 108150. https://doi.org/10.1016/j.optlastec.2022.108150
  7. Chen X., Xiao Y., Cheng Y., Zhang Z., Gou Y., Wang J. MOCVD growth and thermal stability analysis of 1.2 µm InGaAs/GaAs multi quantum well structure. Journal of Alloys and Compounds, 2022, vol. 922, pp. 166173 https://doi.org/10.1016/j.jallcom.2022.166173
  8. Mintairov S.A., Emelyanov V.M., Rybalchenko D.V., Salii R.A., Timoshina N.K., Shvarts M.Z., Kalyuzhnyy N.A. Heterostructures of metamorphic GaInAs photovoltaic converters fabricated by MOCVD on GaAs substrates. Semiconductors, 2016, vol. 50, no. 4, pp. 517–522. https://doi.org/10.1134/S1063782616040163
  9. Devitsky O.V., Zakharov A.A., Lunin L.S., Sysoev I.A., Pashchenko A.S., Vakalov D.S., Chapura O.M. Influence of magnetron sputtering conditions on the structure and surface morphology of InxGa1–xAs thin films on a GaAs (100) substrate. Condensed Matter and Interphases, 2022, vol. 24, no. 3, pp. 300–305. https://doi.org/10.17308/kcmf.2022.24/9851
  10. Lunin L.S., Lunina M.L., Devitsky O.V., Sysoev I.A. Pulsed laser deposition of AlxGa1–xAs and GaP thin films onto Si substrates for photoelectric converters. Semiconductors, 2017, vol. 51, no. 3, pp. 387–391. https://doi.org/10.1134/S1063782617030174
  11. Sysoev I.A. Epitaxy of Solid Solutions of A3B5 Compounds with Micro and Nanostructures in the Field of a Temperature Gradient. Thesis for the degree of Doctor of Technical Sciences.Stavropol, 2010. (in Russian)
  12. Gorbatchev A., De Anda Salazar F., Galván Montalvo J.A., Michournyi V. Peculiarities of the thermodynamic conditions to grow InGaAs epitaxial layers by LPE on GaAs substrate at low temperatures. MRS Advances, 2021, vol. 6, no. 46, pp. 1005–1009. https://doi.org/10.1557/s43580-021-00198-8
  13. Lozovsky V.N., Lunin L.S., Popov V.P. Zone Recrystallization of Semiconductor Materials with a Temperature Gradient. Moscow, Metallurgy Publ., 1987, 232 p. (in Russian)
  14. Sysoev I.A., Lunin L.S. Gradient Epitaxy for Obtaining Micro- and Nanostructures of III–V Solid Solutions Through a thin Gas Phase. Stavropol, NCFU Publ., 2015, 94 p. (in Russian)
  15. Kulikov I.S. Thermodynamics of Oxides. Moscow, Metallurgy Publ., 1986, 344 p. (in Russian)
  16. Dehaese O., Wallart X., Mollot F. Kinetic model of element III segregation during molecular beam epitaxy of III‐III’‐V semiconductor compounds. Applied Physics Letters, 1995, vol. 66, no. 1, pp. 52–54. https://doi.org/10.1063/1.114180
  17. Zheng Y.-J., Lam A.M., Engstrom J.R. Modeling of Ge surface segregation in vapor-phase deposited Si1-xGex thin films. Applied Physics Letters, 1999, vol. 75, no. 6,pp. 817–819. https://doi.org/10.1063/1.124523
  18. Pashchenko A.S., Devitsky O.V., Lunin L.S., Kasyanov I.V., Nikulin D.A., Pashchenko O.S. Structure and morphology of GaInAsP solid solutions on GaAs substrates grown by pulsed laser deposition. Thin Solid Films, 2022, vol. 743, pp. 139064. https://doi.org/10.1016/j.tsf.2021.139064


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