DIGITAL IMAGE ABERRATION CORRECTION TECHNIQUE FOR STRUCTURED ILLUMINATION MICROSCOPY

Inochkin F.M., Belashenkov N.R. Digital image aberration correction technique for structured illumination microscopy. Scientific and Technical Journal of Information Technologies, Mechanics and Optics, 2019, vol. 19, no. 6, pp. 1004–1012 (in Russian). doi: 10.17586/2226-1494-2019-19-6-1004-1012

Subject of Research. The paper presents research of image restoration quality decrease for the super-resolution structured illumination microscopy in case of defocus and aberrations affecting resulting image. Method. In order to improve restoration image quality, we propose image preprocessing procedure for compensation of defocus and aberrations along with point spread function reconstruction, based on Fourier optics theory and preliminary system calibration. We also propose a technique for automatic point spread function model adaptation to a defocus value by means of acquired images analysis, taking into account input data redundancy of structured illumination microscopy. Main Results. The proposed technique provides opportunity to reduce reconstructed image artifacts for systems with aberrations and unknown defocus to the same level as can be achieved with the diffraction-limited optics. Obtained simulation results demonstrate three-four-fold artifact amplitude decrease for reconstructed images for systems with aberrations, that can be expected for commercially-available objectives. Practical Relevance. Research results are applicable for image restoration quality improvement in super-resolution structured illumination microscopes, and also decrease the cost of new systems by means of non-specific optics without sacrificing high quality of resulting image.

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