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Editor-in-Chief
Nikiforov
Vladimir O.
D.Sc., Prof.
Partners
ELLIPSOMETRIC RESEARCH MODEL OF THE OPTICAL GLUE CONNECTIONS CHARACTERISTICS
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Abstract
An opportunity to carry out researches of the glue connections stress state for the optical parts with the help of the compensatory type ellipsometer, working at PCSA scheme, is considered. Ellipsometric research mathematical model of the induced birefringence in connection layer caused by the integral effect of photoelasticity is described
Keywords:
glue connection, stress state, ellipsometry, connection layer, induced birefringence, photoelasticity.