E. V. Ushakova, V. V. Golubkov, A. P. Litvin, P. S. Parfenov, A. V. Baranov

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The paper deals with self-organization process of semiconductor lead sulfide nanoparticles with a luminescence in the range of 0.8–2 mkm. Corresponding diameters of nanoparticles determined by X-ray analysis lie in the range of 2.5–8 nm. Nanostructures are fabricated by evaporation of solvent on a glass substrate and by embedding in a porous matrix. The process of self-organization on the substrate and in the matrix is studied by means of X-ray structural analysis. It is shown that self-organized nanostructures are ordered structures consisted of close-packed nanoparticles. A formation of spatial regulation of nanoparticles leads to the appearance of specific maxima in the angular dependence of X-rays scattering, which position is determined by the period of the structure. It is found that the type of this regulation is independent of the size of nanoparticles, type of substrate and matrix. It is shown that a distance between nanoparticles centers in obtained structures depends linearly on its diameter, and the average value of the slope coefficient of size dependence is (1,2±0,1).

Keywords: quantum dot, nanoparticle, superlattice, X-ray structural analysis, lead sulfide

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