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Editor-in-Chief
Nikiforov
Vladimir O.
D.Sc., Prof.
Partners
Sokolov Vladimir
Work place: Ioffe Physical Technical Institute
Degree: D.Sc., Professor
Degree: D.Sc., Professor
Sokolov V., Huynh Cong Tu POROUS SILICON THIN FILM EFFECT ON SPECTRAL CHARACTERISTIC OF SILICON PHOTODIODE
The article was published in issue 4, volume 11, 2011
The article was published in issue 4, volume 11, 2011
Skvortsov A. M., Sokolov V., Khalestkiy R. Исследование гистерезиса
вольт-емкостных характеристик структур кремний-окисел с поликремниевым
затвором при воздействии ионизирующего излучения
The article was published in issue 9, volume 06, 2006
The article was published in issue 9, volume 06, 2006
Skvortsov A. M., Sokolov V., Khalestkiy R., Смирнов Ю. В. Деградация структур
Si-SiO2 с поликремниевым затвором при гамма-облучении в зависимости
от напряжения смещения
The article was published in issue 9, volume 06, 2006
The article was published in issue 9, volume 06, 2006