Author Vladimir Sokolov Journal Scientific and Technical Of Information Technologies, Mechanics and Optics

2021 , VOLUME 21, NUMBER 5 ( september-october )

ISSN 2226-1494 (print), ISSN 2500-0373 (online)

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Publications

Editor-in-Chief

Nikiforov
Vladimir O.
D.Sc., Prof.

Partners

Sokolov Vladimir

Work place: Ioffe Physical Technical Institute
Degree: D.Sc., Professor

Sokolov V., Huynh Cong Tu POROUS SILICON THIN FILM EFFECT ON SPECTRAL CHARACTERISTIC OF SILICON PHOTODIODE
The article was published in issue 4, volume 11, 2011

Skvortsov A. M., Sokolov V., Khalestkiy R. Исследование гистерезиса вольт-емкостных характеристик структур кремний-окисел с поликремниевым затвором при воздействии ионизирующего излучения
The article was published in issue 9, volume 06, 2006

Skvortsov A. M., Sokolov V., Khalestkiy R., Смирнов Ю. В. Деградация структур Si-SiO2 с поликремниевым затвором при гамма-облучении в зависимости от напряжения смещения
The article was published in issue 9, volume 06, 2006

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