PROBE FOR SCANNING ION-CONDUCTANCE MICROSCOPY

2010 , VOLUME 10, NUMBER 4 ( JULY-AUGUST )

ISSN 2226-1494 (print), ISSN 2500-0373 (online)

Publications

Editor-in-Chief

Nikiforov
Vladimir O.
D.Sc., Prof.

Partners

A. Golubok, V. Levichev, V. Matyzhonok, A. Stovpyaga

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Abstract

The piezoelectric sensor for scanning probe microscope with a probe in the form of a glass micropipette for

scanning ion-conductance microscopy has been made. Resonant frequency and Q-quality of the sensor have been

measured in the air and liquid environments. Nanotip has been created for spatial resolution improvement of a

microprobe by means of the focused ion beam at a pipette butt end. Using a test grid, the spatial resolution of a

microprobe with nanotip is shown. The conclusion about an opportunity of using the sensor with a micropipette

in the liquid environment with simultaneous activity in semi contact force mode and in a mode of measurement

of ionic currents has been made.

Keywords: scanning ion-conductance microscope, micropipette