Khalestkiy Roman

Work place: ITMO University
Degree: Associate professor, Ph.D.
E-mail: halecky@yandex.ru
Khalestkiy R., Pham Q. T. THE INFLUENCE OF YLP - LASER RADIATION ON THE CURRENT-VOLTAGE CHARACTERISTICS OF THE SILICON-SILICON DIOXIDE SYSTEM
The article was published in issue 6, volume 09, 2009
Khalestkiy R., Skvortsov A. M., Семенов А. Е., Новиков С. Н., Фролкова Е. Г. Исследование структурных дефектов межслойной изоляции в КМОП ИС
The article was published in issue 4, volume 03, 2003
Фролкова Е. Г., Khalestkiy R., Skvortsov A. M., Семенов А. Е., Новиков С. Н. Исследование пробивных напряжений межслойной изоляции в КМОП ИС
The article was published in issue 4, volume 03, 2003
Семенов А. М., Khalestkiy R., Skvortsov A. M. Исследование МОП-структур с окислами, полученными при различных режимах окисления
The article was published in issue 4, volume 03, 2003
Kuznetsova O. V., Pham Q. T., Khalestkiy R. DEFECTS INVESTIGATION OF SI/SIO2 SYSTEM FORCED BY LASER IRRADIATION
The article was published in issue 5, volume 10, 2010
Skvortsov A. M., Khalestkiy R., Huynh Cong Tu EFFECT OF LASER MICRO STRUCTURING PROCESS ON ELECTROPHYSICAL PROPERTIES OF SIO2/SI SYSTEM
The article was published in issue 1, volume 13, 2013
Skvortsov A. M., Huynh Cong Tu, Khalestkiy R. MICROSTRUCTURING MECHANISM OF SiO2/Si SYSTEM UNDER IRRADIATION BY A SCANNING PULSED FIBER LASER BEAM
The article was published in issue 3, volume 13, 2013
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